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Test-Driven Development in Go

You're reading from   Test-Driven Development in Go A practical guide to writing idiomatic and efficient Go tests through real-world examples

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Product type Paperback
Published in Apr 2023
Publisher Packt
ISBN-13 9781803247878
Length 342 pages
Edition 1st Edition
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Author (1):
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Adelina Simion Adelina Simion
Author Profile Icon Adelina Simion
Adelina Simion
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Table of Contents (18) Chapters Close

Preface 1. Part 1: The Big Picture
2. Chapter 1: Getting to Grips with Test-Driven Development FREE CHAPTER 3. Chapter 2: Unit Testing Essentials 4. Chapter 3: Mocking and Assertion Frameworks 5. Chapter 4: Building Efficient Test Suites 6. Part 2: Integration and End-to-End Testing with TDD
7. Chapter 5: Performing Integration Testing 8. Chapter 6: End-to-End Testing the BookSwap Web Application 9. Chapter 7: Refactoring in Go 10. Chapter 8: Testing Microservice Architectures 11. Part 3: Advanced Testing Techniques
12. Chapter 9: Challenges of Testing Concurrent Code 13. Chapter 10: Testing Edge Cases 14. Chapter 11: Working with Generics 15. Assessments 16. Index 17. Other Books You May Enjoy

Usages of fuzzing

As discussed previously, it is very difficult to write tests that cover all possible user scenarios and parameter value ranges. The number of test cases to write and maintain can become even more time-consuming than project work. In this section, we will explore Go’s fuzz testing capability, which can help us write tests that cover a wide variety of inputs.

Fuzz testing is a powerful technique that has been used to find bugs in a wide variety of software systems, including the Go standard library itself. It involves generating a wide variety of values and using them as input to the UUT. The generated values stress-test the UUT and help uncover bugs or unexpected behavior such as panics, memory leaks, or incorrect outputs.

Fuzz tests are automated, black-box tests that can be used to detect any potential functional or security issues in our system. They are usually run using a fuzz tool, which takes care of value generation, test execution, and error detection...

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